Cost Management Strategies and Approved Components List for Electronic Parts Management

Vernon Densler is a Senior Product Manager at SiliconExpert.  He has been with SiliconExpert since 2018 and previously spent 18 years at Northrop Grumman as both a Systems Engineer and Manager in charge of Obsolescence Management and Spares & Repairs.  Vernon holds a BS in Computer Information Systems, Management from Florida Institute of Technology.  Vernon frequently speaks at industry events and symposiums, where he is able to use his experience in the Parts Management field to assist in furthering best practices and the Parts Management discipline.

Prof Michael Pecht (25,000+ citations, 70+ H-Index) has a BS in Physics, an MS in Electrical Engineering and an MS and PhD in Engineering Mechanics from the University of Wisconsin. He is a Professional Engineer, an IEEE Fellow, a PHM Society Life Fellow, an ASME Fellow, an SAE Fellow and an IMAPS Fellow. He served as editor-in-chief of IEEE Access for six years, as editor-in-chief of IEEE Transactions on Reliability for nine years, editor-in-chief of Microelectronics Reliability for sixteen years, and editor of Circuit World. He has also served on three U.S. National Academy of Science studies, two US Congressional investigations in automotive safety, and as an expert to the U.S. FDA. He is the Director of CALCE (Center for Advanced Life Cycle Engineering) at the University of Maryland (UMd), which is funded by over 150 of the world’s leading electronics companies at more than US$6M/year. He is also a Professor in Applied Mathematics at UMd. He has written more than twenty books on product reliability, development, use and supply chain management.  He has also written a series of books of the electronics industry in China, Korea, Japan and India. He has written over 700 technical articles and has 10 patents. In 2015 he was awarded the IEEE Components, Packaging, and Manufacturing Award for visionary leadership in the development of physics-of-failure-based and prognostics-based approaches to electronics reliability. He was also awarded the Chinese Academy of Sciences President's International Fellowship. In 2010, he received the IEEE Exceptional Technical Achievement Award for his innovations in the area of prognostics and systems health management.  In 2008, he was awarded the highest reliability honor, the IEEE Reliability Society’s Lifetime Achievement Award.